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1

p-GaN Gate HEMTs With Tungsten Gate Metal for High Threshold Voltage and Low Gate Current

Hwang, Injun, Kim, Jongseob, Choi, Hyuk Soon, Choi, Hyoji, Lee, Jaewon, Kim, Kyung Yeon, Park, Jong-Bong, Lee, Jae Cheol, Ha, Jongbong, Oh, Jaejoon, Shin, Jaikwang, Chung, U-In

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 530 KB

english, 2013

2

[Japan Soc. Applied Phys 2003 Symposium on VLSI Technology. Digest of Technical Papers - Kyoto, Japan (10-12 June 2003)] 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) - An edge contact type cell for Phase Change RAM featuring very low power consumption

Ha, Y.H., Yi, J.H., Horii, H., Park, J.H., Joo, S.H., Park, S.O., U-In Chung,, Moon, J.T.

Year:

2003

Language:

english

File:

PDF, 181 KB

english, 2003

3

[IEEE IEEE 1999 International Interconnect Technology Conference - San Francisco, CA, USA (24-26 May 1999)] Proceedings of the IEEE 1999 International Interconnect Technology Conference (Cat. No.99EX247) - Plasma charge-induced corrosion of tungsten-plug vias in CMOS devices

Jang-Eun Lee,, Ju-Hyuk Chung,, Heungsoo Park,, Tae Wook Seo,, Sun-Hoo Park,, U-In Chung,, Geung-Won Kang,, Moon-Yong Lee,

Year:

1999

Language:

english

File:

PDF, 383 KB

english, 1999

4

[IEEE IEEE 1999 International Interconnect Technology Conference - San Francisco, CA, USA (24-26 May 1999)] Proceedings of the IEEE 1999 International Interconnect Technology Conference (Cat. No.99EX247) - A mechanism of stress-induced metal void in narrow aluminum-based metallization with the HDP CVD oxide dielectric

Soo Geun Lee,, Heok-Sang Oh,, Sun-Rae Kim,, Seung-Heon Song,, Sun Hu Park,, U-In Chung,, Geung Won Kang,

Year:

1999

Language:

english

File:

PDF, 363 KB

english, 1999

5

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - New approaches to improve the endurance of TiN/HfO/sub 2//TiN capacitor during the back-end process for 70nm DRAM device

Jae Hyoung Choi,, Jeong-Hee Chung,, Se-Hoon Oh,, Jeong Sik Choi,, Cha-Young Yoo,, Sung-Tae Kim,, U-In Chung,, Joo-Tae Moon,

Year:

2003

Language:

english

File:

PDF, 320 KB

english, 2003

6

Elimination of surface state induced edge transistors in high voltage NMOSFETs for flash memory devices

Jin-Wook Lee, Gyoung Ho Buh, Guk-Hyon Yon, Tai-su Park, Yu Gyun Shin, U-In Chung, Joo-Tae Moon

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 1.23 MB

english, 2005

7

A comparative analysis of thermal gate oxide on strained Si/relaxed SiGe layer for reliability prediction of strained Si MOSFETs

Sun-Ghil Lee, Young Pil Kim, Hye-Lan Lee, Beom Jun Jin, Jong-Wook Lee, Yu Gyun Shin, Siyoung Choi, U-In Chung, Joo Tae Moon

Journal:

Materials Science in Semiconductor Processing

Year:

2005

Language:

english

File:

PDF, 198 KB

english, 2005

8

Investigation of Ni/Co bilayer salicidation process for sub-40 nm gate technology

Eun Ji Jung, Sug-Woo Jung, Hyun-Su Kim, Jong-Ho Yun, Seong Hwee Cheong, Byung Hee Kim, Gil Heyun Choi, Sung Tae Kim, U-In Chung, Joo Tae Moon, Byung Il Ryu

Journal:

Microelectronic Engineering

Year:

2005

Language:

english

File:

PDF, 287 KB

english, 2005

9

Development of magnetic tunnel junction for toggle MRAM

Kim, H.-J., Oh, S.C., Bae, J.S., Nam, K.T., Lee, J.E., Park, S.O., Kim, H.S., Lee, N.I., U-In Chung, Moon, J.T., Kang, H.K.

Journal:

IEEE Transactions on Magnetics

Year:

2005

Language:

english

File:

PDF, 169 KB

english, 2005

10

[IEEE 2007 IEEE Symposium on VLSI Technology - Kyoto, Japan (2007.06.12-2007.06.14)] 2007 IEEE Symposium on VLSI Technology - Highly Scalable Phase Change Memory with CVD GeSbTe for Sub 50nm Generation

Lee, J.I., Park, H., Cho, S.L., Park, Y.L., Bae, B.J., Park, J.H., Park, J.S., An, H.G., Bae, J.S., Ahn, D.H., Kim, Y.T., Horii, H., Song, S.A., Shin, J.C., Park, S.O., Kim, H.S., Chung, U-In., Moon,

Year:

2007

Language:

english

File:

PDF, 862 KB

english, 2007

11

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - A unified 7.5nm dash-type confined cell for high performance PRAM device

Im, D.H., Lee, J. I., Cho, S.L., An, H.G., Kim, D.H., Kim, I.S., Park, H., Ahn, D.H., Horii, H., Park, S.O., Chung, U-In, Moon, J.T.

Year:

2008

Language:

english

File:

PDF, 816 KB

english, 2008

12

Source-Connected p-GaN Gate HEMTs for Increased Threshold Voltage

Hwang, Injun, Oh, Jaejoon, Choi, Hyuk Soon, Kim, Jongseob, Choi, Hyoji, Kim, Joonyong, Chong, Soogine, Shin, Jaikwang, Chung, U-In

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 500 KB

english, 2013

13

[IEEE 2012 24th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Bruges, Belgium (2012.06.3-2012.06.7)] 2012 24th International Symposium on Power Semiconductor Devices and ICs - 1.6kV, 2.9 mΩ cm2 normally-off p-GaN HEMT device

Hwang, Injun, Choi, Hyoji, Lee, JaeWon, Choi, Hyuk Soon, Kim, Jongseob, Ha, Jongbong, Um, Chang-Yong, Hwang, Sun-Kyu, Oh, Jaejoon, Kim, Jun-Youn, Shin, Jai Kwang, Park, Youngsoo, Chung, U-in, Yoo, In-

Year:

2012

Language:

english

File:

PDF, 811 KB

english, 2012

14

Flutter-driven triboelectrification for harvesting wind energy

Bae, Jihyun, Lee, Jeongsu, Kim, SeongMin, Ha, Jaewook, Lee, Byoung-Sun, Park, YoungJun, Choong, Chweelin, Kim, Jin-Baek, Wang, Zhong Lin, Kim, Ho-Young, Park, Jong-Jin, Chung, U-In

Journal:

Nature Communications

Year:

2014

Language:

english

File:

PDF, 2.48 MB

english, 2014

15

Verification of Interface State Properties of a-InGaZnO Thin-Film Transistors With $\hbox{SiN}_{x}$ and $ \hbox{SiO}_{2}$ Gate Dielectrics by Low-Frequency Noise Measurements

Choi, Hyun-Sik, Jeon, Sanghun, Kim, Hojung, Shin, Jaikwang, Kim, Changjung, Chung, U-In

Journal:

IEEE Electron Device Letters

Year:

2011

Language:

english

File:

PDF, 347 KB

english, 2011

16

[Japan Soc. Applied Phys 2003 Symposium on VLSI Technology. Digest of Technical Papers - Kyoto, Japan (10-12 June 2003)] 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) - A novel NF/sub 3/-HDP-CVD process for STI-filling in sub-90 nm DRAM and beyond

Yong-Won Cha,, Sang-Ho Rha,, Won-Jin Kim,, Kyu-Tae Na,, U-In Chung,, Joo-Tae Moon,

Year:

2003

Language:

english

File:

PDF, 189 KB

english, 2003

17

[IEEE 12th IEEE International Conference on Advanced Thermal Processing of Semiconductors - Portland, OR, USA (28-30 Sept. 2004)] 12th IEEE International Conference on Advanced Thermal Processing of Semiconductors, 2004. RTP 2004. - Effect of a noble annealing system on nickel silicide formation

Sug-Woo Jung,, Hyun-Su Kim,, Eun-Ji Jung,, Seong-Hwee Cheong,, Jong-Ho Yun,, Kwan-Jong Roh,, Ja-Hum Ku,, Gil-Heyun Choi,, Sung-Tae Kim,, U-In Chung,, Joo-Tae Moon,, Byung-Il Ryu,

Year:

2004

Language:

english

File:

PDF, 491 KB

english, 2004

18

[Japan Soc. Applied Phys 2003 Symposium on VLSI Technology. Digest of Technical Papers - Kyoto, Japan (10-12 June 2003)] 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) - TiN/HfO/sub 2//TiN capacitor technology applicable to 70 nm generation DRAMs

Se-Hoon Oh,, Jeong-Hee Chung,, Jae-Hyoung Choi,, Cha-Young Yoo,, Young Sun Kim,, Sung Tae Kim,, U-In Chung,, Joo Tae Moon,

Year:

2003

Language:

english

File:

PDF, 203 KB

english, 2003

19

Investigation on Resistive Memory Switching Mechanism of NiO

KIM, D. C., SEO, S., SUH, D.-S., JUNG, R., LEE, C. W., SHIN, J. K., YOO, I. K., BAEK, I. G., KIM, H. J., YIM, E. K., LEE, C. W., PARK, S. O., KIM, H. S., CHUNG, U-IN, MOON, J. T., RYU, B. I., KIM, J.-

Journal:

Integrated Ferroelectrics

Year:

2007

Language:

english

File:

PDF, 318 KB

english, 2007

20

Impact of transparent electrode on photoresponse of ZnO-based phototransistor

Lee, Seunghyup, Ahn, Seung-Eon, Jeon, Yongwoo, Ahn, Ji-Hoon, Song, Ihun, Jeon, Sanghun, Yun, Dong-Jin, Kim, Jungwoo, Choi, Hyung, Chung, U-in, Park, Jaechul

Journal:

Applied Physics Letters

Year:

2013

Language:

english

File:

PDF, 1.21 MB

english, 2013

21

Instability in threshold voltage and subthreshold behavior in Hf–In–Zn–O thin film transistors induced by bias-and light-stress

Ghaffarzadeh, Khashayar, Nathan, Arokia, Robertson, John, Kim, Sangwook, Jeon, Sanghun, Kim, Changjung, Chung, U-In, Lee, Je-Hun

Journal:

Applied Physics Letters

Year:

2010

Language:

english

File:

PDF, 758 KB

english, 2010

22

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Robust multi-bit programmable flash memory using a resonant tunnel barrier

Shieun Kim,, Seung Jae Baik,, Zongliang Huo,, Young-Jin Noh,, Chulsung Kim,, Jeong Hee Han,, In-Seok Yeo,, U-In Chung,, Joo Tae Moon,, Byung-Il Ryu,

Year:

2005

Language:

english

File:

PDF, 787 KB

english, 2005

23

The effects of phosphorus on the hydrogen trapping at grain boundaries in low carbon steel

Jai-Young Lee, U-In Chung, Duk-Soo Ahn

Journal:

Materials Science and Engineering

Year:

1987

Language:

english

File:

PDF, 573 KB

english, 1987

24

Engineering on tunnel barrier and dot surface in Si nanocrystal memories

Seung Jae Baik, Siyoung Choi, U-In Chung, Joo Tae Moon

Journal:

Solid-State Electronics

Year:

2004

Language:

english

File:

PDF, 311 KB

english, 2004

25

Body-tied triple-gate NMOSFET fabrication using bulk Si wafer

Tai-su Park, Siyoung Choi, Deok-Hyung Lee, U-In Chung, Joo Tae Moon, Euijoon Yoon, Jong-Ho Lee

Journal:

Solid-State Electronics

Year:

2005

Language:

english

File:

PDF, 560 KB

english, 2005

26

Low temperature crystallized Ta2O5/Nb2O5 bi-layers integrated into RIR capacitor for 60 nm generation and beyond

Kyuho Cho, Jinil Lee, Jae-Soon Lim, Hanjin Lim, Junghyun Lee, Sungho Park, Cha-Young Yoo, Sung-Tae Kim, U-In Chung, Joo-Tae Moon

Journal:

Microelectronic Engineering

Year:

2005

Language:

english

File:

PDF, 350 KB

english, 2005

27

[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting -

Lee, Jaeho, Hyun-Jong Chung,, Lee, Jaehong, Shin, Hyungcheol, Jinseong Heo,, Heejun Yang,, Sung-Hoon Lee,, Sunae Seo,, Jaikwang Shin,, U-in Chung,, Inkyeong Yoo,, Kinam Kim,

Year:

2010

Language:

english

File:

PDF, 988 KB

english, 2010

28

Metal Oxide Thin Film Phototransistor for Remote Touch Interactive Displays

Seung-Eon Ahn, Ihun Song, Sanghun Jeon, Youg Woo Jeon, Young Kim, Changjung Kim, Byungki Ryu, Je-Hun Lee, Arokia Nathan, Sungsik Lee, Gyu Tae Kim, U-In Chung

Journal:

Advanced Materials

Year:

2012

Language:

english

File:

PDF, 761 KB

english, 2012

29

Impacts of fluorine on GaN high electron mobility transistors: Theoretical study

Ki-Ha Hong, Injun Hwang, Hyuk Soon Choi, Jaejoon Oh, Jaikwang Shin, U-In Chung, Jongseob Kim

Journal:

physica status solidi (RRL) - Rapid Research Letters

Year:

2010

Language:

english

File:

PDF, 167 KB

english, 2010

30

Subgap Density-of-States-Based Amorphous Oxide Thin Film Transistor Simulator (DeAOTS)

Yong Woo Jeon, Sungchul Kim, Sangwon Lee, Dong Myong Kim, Dae Hwan Kim, Jaechul Park, Chang Jung Kim, Ihun Song, Youngsoo Park, U-In Chung, Je-Hun Lee, Byung Du Ahn, Sei Yong Park, Jun-Hyun Park, Joo

Journal:

IEEE Transactions on Electron Devices

Year:

2010

Language:

english

File:

PDF, 1.77 MB

english, 2010

31

Three-Dimensional Integration Approach to High-Density Memory Devices

Hojung Kim, Sanghun Jeon, Myoung-Jae Lee, Jaechul Park, Sangbeom Kang, Hyun-Sik Choi, Churoo Park, Hong-Sun Hwang, Changjung Kim, Jaikwang Shin, U-In Chung

Journal:

IEEE Transactions on Electron Devices

Year:

2011

Language:

english

File:

PDF, 1.08 MB

english, 2011

32

3.1: Invited Paper: Amorphous Oxide TFTs: Progress and Issues

Arokia Nathan, Sungsik Lee, Sanghun Jeon, Ihun Song, U-In Chung

Journal:

SID Symposium Digest of Technical Papers

Year:

2012

Language:

english

File:

PDF, 419 KB

english, 2012

33

A study on hydrogen-induced amorphization in the LaNi system

U-In Chung, Jai-Young Lee

Journal:

Journal of Non-Crystalline Solids

Year:

1989

Language:

english

File:

PDF, 553 KB

english, 1989

34

A differential scanning calorimetry study of hydrogen-induced amorphizatiqn in GdMn2, PrMn2 and NdMn2 laves phases

Chung U-In, Lee Jai-Young

Journal:

Journal of the Less Common Metals

Year:

1990

Language:

english

File:

PDF, 607 KB

english, 1990

35

Investigation for Resistive Switching by Controlling Overflow Current in Resistance Change Nonvolatile Memory

Ahn, Seung-Eon, Lee, Myoung-Jae, Kang, Bo Soo, Lee, Dongsoo, Kim, Chang-Jung, Kim, Dong-Sik, Chung, U-In

Journal:

IEEE Transactions on Nanotechnology

Year:

2012

Language:

english

File:

PDF, 336 KB

english, 2012

36

A fast, high-endurance and scalable non-volatile memory device made from asymmetric Ta2O5−x/TaO2−x bilayer structures

Lee, Myoung-Jae, Lee, Chang Bum, Lee, Dongsoo, Lee, Seung Ryul, Chang, Man, Hur, Ji Hyun, Kim, Young-Bae, Kim, Chang-Jung, Seo, David H., Seo, Sunae, Chung, U-In, Yoo, In-Kyeong, Kim, Kinam

Journal:

Nature Materials

Year:

2011

Language:

english

File:

PDF, 799 KB

english, 2011

37

[IEEE 2002 Symposium on VLSI Technology Digest of Technical Papers - Honolulu, HI, USA (11-13 June 2002)] 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) - Void free and low stress shallow trench isolation technology using P-SOG for sub 0.1 μm device

Jin-Hwa Heo,, Soo-Jin Hong,, Dong-Ho Ahn,, Hyun-Duk Cho,, Moon-Han Park,, Fujihara, K., U-In Chung,, Yong-Chul Oh,, Joo-Tae Moon,

Year:

2002

Language:

english

File:

PDF, 256 KB

english, 2002

38

[IEEE 2011 69th Annual Device Research Conference (DRC) - Santa Barbara, CA, USA (2011.06.20-2011.06.22)] 69th Device Research Conference - Integration of high quality top-gated graphene field effect devices on 150 mm substrate

Heo, Jinseong, Chung, Hyun-Jong, Lee, Sung-Hoon, Yang, Heejun, Shin, Jaikwang, Chung, U-In, Seo, Sunae

Year:

2011

Language:

english

File:

PDF, 1.43 MB

english, 2011

39

[IEEE 2012 IEEE Vehicle Power and Propulsion Conference (VPPC) - Seoul, Korea (South) (2012.10.9-2012.10.12)] 2012 IEEE Vehicle Power and Propulsion Conference - IPMSM torque control method considering DC-link voltage variation and friction torque for EV/HEV applications

Jung-Hyo Lee,, Chung-Yuen Won,, Byoung-Kuk Lee,, Hyun-Bae Kim,, Jei-Hoon Baek,, Kyu-Bum Han,, U-In Chung,

Year:

2012

Language:

english

File:

PDF, 2.60 MB

english, 2012

40

SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XVII - Polychromatic white LED using GaN nano pyramid structure

Kim, Taek, Kim, Jusung, Yang, Moonseung, Park, Yongsoo, Chung, U-In, Ko, Yongho, Cho, Yonghoon, Streubel, Klaus P., Jeon, Heonsu, Tu, Li-Wei, Strassburg, Martin

Year:

2013

Language:

english

File:

PDF, 1005 KB

english, 2013

41

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Optical Microlithography XXV - Extending the DRAM and FLASH memory technologies to 10nm and beyond

Kim, Kinam, Chung, U-In, Park, Youngwoo, Lee, Jooyoung, Yeo, Jeongho, Kim, Dongchan, Conley, Will

Year:

2012

Language:

english

File:

PDF, 2.83 MB

english, 2012

42

Nonmonotonic temperature dependent transport in graphene grown by chemical vapor deposition

Heo, J., Chung, H. J., Lee, Sung-Hoon, Yang, H., Seo, D. H., Shin, J. K., Chung, U-In, Seo, S., Hwang, E. H., Das Sarma, S.

Journal:

Physical Review B

Year:

2011

Language:

english

File:

PDF, 425 KB

english, 2011

43

Proceedings of SPIE [SPIE Gallium Nitride Materials and Devices VII - San Francisco, California, USA (Monday 23 January 2012)] - Highly efficient InGaN/GaN blue LED on 8-inch Si (111) substrate

Kim, Jun-Youn, Tak, Youngjo, Kim, Jaekyun, Hong, Hyun-Gi, Chae, Suhee, Lee, Jae Won, Choi, Hyoji, Park, Youngsoo, Chung, U-In, Kim, Jong-Ryeol, Shim, Jong-In

Year:

2012

Language:

english

File:

PDF, 3.06 MB

english, 2012

44

Trap-limited and percolation conduction mechanisms in amorphous oxide semiconductor thin film transistors

Lee, Sungsik, Ghaffarzadeh, Khashayar, Nathan, Arokia, Robertson, John, Jeon, Sanghun, Kim, Changjung, Song, I-Hun, Chung, U-In

Journal:

Applied Physics Letters

Year:

2011

Language:

english

File:

PDF, 827 KB

english, 2011

45

In situ observation of filamentary conducting channels in an asymmetric Ta2O5−x/TaO2−x bilayer structure

Park, Gyeong-Su, Kim, Young Bae, Park, Seong Yong, Li, Xiang Shu, Heo, Sung, Lee, Myoung-Jae, Chang, Man, Kwon, Ji Hwan, Kim, M., Chung, U-In, Dittmann, Regina, Waser, Rainer, Kim, Kinam

Journal:

Nature Communications

Year:

2013

Language:

english

File:

PDF, 1.79 MB

english, 2013

46

[Japan Soc. Applied Phys 2003 Symposium on VLSI Technology. Digest of Technical Papers - Kyoto, Japan (10-12 June 2003)] 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) - A novel cell technology using N-doped GeSbTe films for phase change RAM

Horii, H., Yi, J.H., Park, J.H., Ha, Y.H., Baek, I.G., Park, S.O., Hwang, Y.N., Lee, S.H., Kim, Y.T., Lee, K.H., U-In Chung,, Moon, J.T.

Year:

2003

Language:

english

File:

PDF, 194 KB

english, 2003

47

A plasma-treated chalcogenide switch device for stackable scalable 3D nanoscale memory

Lee, Myoung-Jae, Lee, Dongsoo, Cho, Seong-Ho, Hur, Ji-Hyun, Lee, Sang-Moon, Seo, David H, Kim, Dong-Sik, Yang, Moon-Seung, Lee, Sunghun, Hwang, Euichul, Uddin, Mohammad Rakib, Kim, Hojung, Chung, U-In

Journal:

Nature Communications

Year:

2013

Language:

english

File:

PDF, 1.83 MB

english, 2013

48

Asymmetric Doping in Silicon Nanostructures: The Impact of Surface Dangling Bonds

Hong, Ki-Ha, Kim, Jongseob, Lee, Jung Hoon, Shin, Jaikwang, Chung, U-In

Journal:

Year:

2010

Language:

english

File:

PDF, 1.39 MB

english, 2010

49

Resolution enhancement of holographic printer using a hogel overlapping method

Hong, Keehoon, Park, Soon-gi, Yeom, Jiwoon, Kim, Jonghyun, Chen, Ni, Pyun, Kyungsuk, Choi, Chilsung, Kim, Sunil, An, Jungkwuen, Lee, Hong-Seok, Chung, U-in, Lee, Byoungho

Journal:

Year:

2013

Language:

english

File:

PDF, 2.08 MB

english, 2013

50

Fabrication and Device Characterization of Omega-Shaped-Gate ZnO Nanowire Field-Effect Transistors

Keem, Kihyun, Jeong, Dong-Young, Kim, Sangsig, Lee, Moon-Sook, Yeo, In-Seok, Chung, U-In, Moon, Joo-Tae

Journal:

Year:

2006

Language:

english

File:

PDF, 437 KB

english, 2006

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